Efficient Plane Segmentation in Depth Image Based on Adaptive Patch-Wise Region Growing
Plane segmentation algorithms are widely used in robotics, serving key roles in scenarios such as indoor localization, scene understanding, and robotic manipulation. These applications typically require real-time, precise, and robust plane segmentation processing, which presents a significant challenge. Existing methods based on pixel-wise or fix-sized patch-wise operation are redundant, as planar regions in real-world scenes are of diverse sizes. In this paper, we introduce a highly efficient method for plane segmentation, namely Adaptive Patch-wise Region Growing (APRG). APRG begins with data sampling to construct a data pyramid. To avoid redundant planer fitting in large planar regions, we introduce an adaptive patch-wise plane fitting algorithm with the pyramid accessed in a top-down manner. The largest possible planar patches are obtained in this process. Subsequently we introduce a region growing algorithm specially designed for our patch representation. Overall, APRG achieves more than 600 FPS at a 640x480 resolution on a mid-range CPU without using parallel acceleration techniques, which outperforms the state-of-the-art method by a factor of 1.46. Besides, in addition to its speedup in run-time, APRG significantly improves the segmentation quality, especially on real-world data.
Authors
- Haochen Niu (ORCID: https://orcid.org/0009-0003-6685-0614)
- Peilin Liu (ORCID: https://orcid.org/0000-0002-5321-2336)
- Fei Wen (ORCID: https://orcid.org/0000-0002-3083-9611)
- Rendong Ying (ORCID: https://orcid.org/0000-0001-6670-149X)
- Lantao Zhang (ORCID: https://orcid.org/0009-0001-5577-0622)
Institutions
- Shanghai Jiao Tong University (CN)
- Shanghai Center for Brain Science and Brain-Inspired Technology (CN)
Publication Details
- Journal
- IEEE Robotics and Automation Letters
- Published
- 2025-03-31
- DOI
- https://doi.org/10.1109/lra.2025.3555862
- Primary Topic
- Industrial Vision Systems and Defect Detection
- Type
- article
- Field-Weighted Citation Impact
- 0.00