Options for Introducing SOVD in SDV Architectures
<div class="section abstract"><div class="htmlview paragraph">The trend for the future mobility concepts in the automotive industry is clearly moving towards autonomous driving and IoT applications in general. Today, the first vehicle manufacturers offer semi-autonomous driving up to SAE level 4. The technical capabilities and the legal requirements are under development. The introduction of data- and computation-intensive functions is changing vehicle architectures towards zonal architectures based on high-performance computers (HPC). Availability of data-connection to the backend and the above explained topics have a major impact on how to test and update such ‘software-defined’ vehicles and entire fleets. Vehicle diagnostics will become a key element for onboard test and update operations running on HPCs, as well as for providing vehicle data to the offboard backend infrastructure via Wi-Fi and 5G at the right time. The standard for Service Oriented Vehicle Diagnostics (SOVD) supports this development. It describes a programming interface for a diagnostic system integrated in the vehicle. It's an API for all vehicle architectures capable of fully onboard testing and updating software. Nevertheless, many car manufacturers will have to define a migration path for introducing it step-by-step throughout the entire life cycle. For this reason, a combination of SOVD-capable and UDS-based legacy onboard and offboard systems will become essential.</div><div class="htmlview paragraph">This paper explains the ideas and the concept of the SOVD standard, shows ideas of handling legacy and the “new world” in a lean approach and illustrates them with some practical examples. In the next step, the SOVD functionality described in the standard document is compared with today’s UDS-based diagnostic approaches and the existing data processes behind them. Finally, a conclusion about whether SOVD has the potential to entirely replace UDS-based diagnostic will be presented.</div></div>
Authors
- Julian Mayer
- Stefan Bschor
- Oliver Fieth
Institutions
- Softing (Germany) (DE)
Publication Details
- Journal
- SAE technical papers on CD-ROM/SAE technical paper series
- Published
- 2025-03-31
- DOI
- https://doi.org/10.4271/2025-01-8081
- Primary Topic
- Radiation Effects in Electronics
- Type
- article
- Field-Weighted Citation Impact
- 0.00