Common Cause Failure Assessment Suitable for a System on a Chip Design According to ISO 13849 Standard

Common cause failures are an important part of the risk and reliability assessment of an integrated circuit. Since it is often impossible to guarantee the full separation of redundant channels implemented in the same System on Chip, in fail-safe operation, mitigation measures are also required within the integrated circuit to control (not only to avoid) the CCF, to reduce the overall risk. Following this approach an alternative approach to the CCF assessment methodology of ISO 13849 Annex F is proposed.