A Wide‐Range Voltage and High‐Speed Progressive Level Shifter With Charge Pump for Embedded Flash Memory

ABSTRACT As embedded flash memory advances to smaller process nodes, supply voltage reductions are necessary to lower dynamic power consumption and ensure the safe operation of increasingly smaller transistors. Embedded flash memory requires reliable signal conversion across multiple voltage domains, a task typically handled by level shifters. However, achieving robust level shifter performance becomes significantly more challenging as supply voltages decrease. This paper presents a wide‐range voltage, high‐speed progressive level shifter utilizing a combination of 1.1‐V thin‐oxide and 5‐V thick‐oxide transistors. When combined with a charge pump, the generated intermediate voltage facilitates efficient signal conversion from low‐ to multiple high‐voltage domains, enabling the proposed LS to achieve robust performance. Postlayout simulations in a 40‐nm CMOS process demonstrate a transition delay of 1.01 ns and energy consumption of 587.86 fJ for a 0.75‐ to 4.5‐V conversion. For a 0.75‐ to 9‐V conversion, the delay is 1.31 ns with energy consumption of 3863.26 fJ, operating at 50 MHz with a 15‐fF output load. These results underscore the robustness and efficiency of the proposed LS, positioning it as a strong candidate for embedded flash memory applications in advanced nodes with reduced supply voltages.

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Publication Details

Journal
International Journal of Circuit Theory and Applications
Published
2025-03-30
DOI
https://doi.org/10.1002/cta.4527
Citations
1
Primary Topic
Low-power high-performance VLSI design
Type
article
Field-Weighted Citation Impact
0.73
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article

A Wide‐Range Voltage and High‐Speed Progressive Level Shifter With Charge Pump for Embedded Flash Memory

Dawei Bi, Zhiyuan Hu, Tao Xu, Zhengxuan Zhang et al.
1 citations
International Journal of Circuit Theory and Applications
Low-power high-performance VLSI design
0.73
article

A Wide‐Range Voltage and High‐Speed Progressive Level Shifter With Charge Pump for Embedded Flash Memory

Dawei Bi, Zhiyuan Hu, Tao Xu, Zhengxuan Zhang, Guoji Qiu
article en
1 citations

Abstract

ABSTRACT As embedded flash memory advances to smaller process nodes, supply voltage reductions are necessary to lower dynamic power consumption and ensure the safe operation of increasingly smaller transistors. Embedded flash memory requires reliable signal conversion across multiple voltage domains, a task typically handled by level shifters. However, achieving robust level shifter performance becomes significantly more challenging as supply voltages decrease. This paper presents a wide‐range voltage, high‐speed progressive level shifter utilizing a combination of 1.1‐V thin‐oxide and 5‐V thick‐oxide transistors. When combined with a charge pump, the generated intermediate voltage facilitates efficient signal conversion from low‐ to multiple high‐voltage domains, enabling the proposed LS to achieve robust performance. Postlayout simulations in a 40‐nm CMOS process demonstrate a transition delay of 1.01 ns and energy consumption of 587.86 fJ for a 0.75‐ to 4.5‐V conversion. For a 0.75‐ to 9‐V conversion, the delay is 1.31 ns with energy consumption of 3863.26 fJ, operating at 50 MHz with a 15‐fF output load. These results underscore the robustness and efficiency of the proposed LS, positioning it as a strong candidate for embedded flash memory applications in advanced nodes with reduced supply voltages.

International Journal of Circuit Theory and ApplicationsVol. 53(11)
Shanghai Institute of Microsystem and Information Technology (CN), University of Chinese Academy of Sciences (CN)
Openalex Percentile: Top 30%
Low-power high-performance VLSI design
0.73
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A Wide‐Range Voltage and High‐Speed Progressive Level Shifter With Charge Pump for Embedded Flash Memory — Dawei Bi, Zhiyuan Hu, et al. · International Journal of Circuit Theory and Applications (2025) | TGRS Research Map | TGRS