Effects of Coincidence Site Lattice (CSL) Grain Boundaries on Secondary Recrystallization in Heavily Cold-rolled Grain-oriented Electrical Steel

Two orientations ({110}<001> and {110}<112>) evolve as secondary grains in heavily cold rolled reduction of 91.5% in grain-oriented silicon steel. We investigated the secondary recrystallization mechanism of these two grains by temperature gradient batch annealing method. This method induces the continuous growth of secondary grains along the temperature gradient direction. Consequently, selective growth behavior can be easily evaluated from macrostructure. Furthermore, the orientation relationships between secondary recrystallized grains and primary recrystallized grains at the interface of them can be investigated by interrupting the temperature gradient batch annealing process during the secondary recrystallization.