Tuning infrared radiative properties using Direct Laser Interference Patterning

• Tailoring of infrared emissivity using Direct Laser Interference Patterning (DLIP). • Experimental validation of emissivity modification through spectral measurements. • Agreement between measured emissivity trends and Rigorous Coupled-Wave Analysis (RCWA) simulations. • Demonstration of directional dependence of emissivity on patterned stainless steel surfaces. In this contribution, the feasibility of tailoring the radiative properties of stainless steel via Direct Laser Interference Patterning (DLIP) is introduced. By fabricating periodic micro- and nano-structures, emissivity is enhanced and made directionally dependent, as evidenced by direct spectral measurements and supported by Rigorous Coupled-Wave Analysis (RCWA) simulations. The experimental findings reveal that the modified surface acts as a spectrally selective emitter with a strong dependence on the emission direction, which is in good overall agreement with the predictions made by Maxwell’s equations. These results show DLIP’s potential for high-throughput, mask-free surface modification, with significant implications for fine-tuning of thermal management, radiative cooling, and related photonic applications.