A two-axis Lloyd's mirror interferometer with elastically bent mirrors for fabrication of variable-line-spacing scale gratings
A cost-effective and flexible laser interference lithography system with an exposure area of approximately 100 mm × 100 mm for fabrication of two-axis variable-line-spacing (VLS) scale gratings is newly proposed and developed. Two elastically bent mirror (EBM) modules, each of which is composed of an elastically bent mirror and a loading mechanism, are integrated into a non-orthogonal two-axis Lloyd's mirror interferometer. The deflections of the X - and Y -EBMs can generate nonlinear components in the wavefronts of the X - and Y -beams, resulting in a stationary interference fringe field with variable pitches along the X - and Y -directions, respectively. The pitch specifications (the center pitch and the pitch variation range) of the grating can be adjusted by changing the corresponding module parameters (the tilt angle and the applied load). Theoretical calculations and experimental results indicate that for EMBs with a dimension of 450 mm (length) × 250 (width) × 2 mm (thickness), the center pitch can be linearly adjusted within the range of 680 nm–1290 nm with respect to a tilt angle range of 10°, while the pitch variation range is independently adjustable from 60 nm to 130 nm with respect to an applied load range of 8 N. Two-axis VLS grating structures with a center pitch of 1000 nm and a pitch variation of ±45 nm are successfully fabricated over a fabrication area of 100 mm × 100 mm, which demonstrates the feasibility of the developed system. • A laser interference lithography (LIL) system is developed for fabricating two-axis VLS scale gratings over 100 mm × 100 mm. • An elastically bent mirror (EBM) module is designed and employed as the wavefront modulator in the LIL system. • VLS scale grating can be customized with changeable pitch specifications (center pitch and pitch variation range). • One-axis and two-axis exposure experiments are conducted to verify the feasibility of the LIL system.
Authors
- Ryo Sato (ORCID: https://orcid.org/0000-0002-5414-1488)
- Hiraku Matsukuma (ORCID: https://orcid.org/0000-0001-8125-9708)
- Wei Gao (ORCID: https://orcid.org/0000-0001-9336-2729)
- Chenguang Yin (ORCID: https://orcid.org/0000-0002-9536-6309)
- Satoshi Kodaka
Institutions
- Tohoku University (JP)
Publication Details
- Journal
- Precision Engineering
- Published
- 2025-03-29
- DOI
- https://doi.org/10.1016/j.precisioneng.2025.03.029
- Citations
- 4
- Primary Topic
- Advanced Measurement and Metrology Techniques
- Type
- article
- Field-Weighted Citation Impact
- 2.85
Funders
- Japan Society for the Promotion of Science
- Japan Science and Technology Agency