SERS Enhancement of CoSe<sub>2</sub> Nanocages via Biphase Junction Strategy
Semiconductor substrates hold significant promise in surface-enhanced Raman scattering (SERS) owing to their excellent selectivity and stability, but their SERS activity is hampered by inefficient interfacial charge transfer (CT). Here, the CoSe<sub>2</sub> nanocages are constructed by biphase junction strategy to improve CT efficiency. Electron localization function (ELF) simulations demonstrated that the orthorhombic phase (o-CoSe<sub>2</sub>) exhibits higher electron delocalization compared to the cubic phase (c-CoSe<sub>2</sub>) due to its metallicity, facilitating interfacial CT. The phase composition of CoSe<sub>2</sub> is modulated by changing the dosage of Se, where reduced Se content increases the o-CoSe<sub>2</sub> phase fraction and metallicity, albeit at the expense of reduced dispersion and surface adsorption sites. Optimizing these competing factors, CoSe<sub>2</sub>-140 achieved optimal SERS performance, enabling the trace detection of carcinogenic p-aminoazobenzene (PAAB) with a limit of detection (LOD) of 5 × 10<sup>-8</sup> m. These biphase junction CoSe<sub>2</sub> nanocages exhibited excellent homogeneity, long-term stability, and resistance to acids/alkalis, demonstrating their potential for practical applications in complex environments. This work established a generalizable biphase junction engineering for amplifying electron delocalization in semiconductor SERS substrates, providing critical insights for designing high-performance semiconductor SERS substrates through crystallographic phase regulation.
Authors
- Xiangyu Meng (ORCID: https://orcid.org/0000-0001-6740-5975)
- Aiguo Wu (ORCID: https://orcid.org/0000-0001-7200-8923)
- Lin Qiu (ORCID: https://orcid.org/0000-0003-3389-3741)
- Xiaoyu Song (ORCID: https://orcid.org/0000-0002-2986-8925)
- Mingjian Zhang (ORCID: https://orcid.org/0009-0006-6514-5317)
- Aochi Liu
- Yuening Wang (ORCID: https://orcid.org/0000-0003-4629-9872)
- Yuanying Ni (ORCID: https://orcid.org/0000-0002-7998-3155)
- Xinnan Yu
- Jie Lin (ORCID: https://orcid.org/0000-0003-4716-4689)
- Jiahao Zhang (ORCID: https://orcid.org/0000-0001-7083-3778)
- Xiaotian Wang (ORCID: https://orcid.org/0000-0002-1337-4875)
- Yue Hu
- Wen Ma (ORCID: https://orcid.org/0009-0004-9510-7579)
- Lei Xu (ORCID: https://orcid.org/0000-0003-4134-3504)
Institutions
- Chinese Academy of Sciences (CN)
- Ningbo Institute of Industrial Technology (CN)
- Hebei University (CN)
- Beihang University (CN)
- University of Science and Technology Beijing (CN)
Publication Details
- Journal
- Small
- Published
- 2025-03-28
- DOI
- https://doi.org/10.1002/smll.202500748
- Citations
- 9
- Primary Topic
- Chalcogenide Semiconductor Thin Films
- Type
- article
- Field-Weighted Citation Impact
- 6.57
Funders
- National Natural Science Foundation of China