High-Precision Modeling and Validation of Electronic Device Characteristics Based on Machine Learning
Modeling the characteristics of electronic devices is a critical step in electronic design and optimization. Traditional modeling methods often rely on physical models or empirical formulas, which struggle to meet the high-precision demands of complex devices. With the rapid development of machine learning technology, its potential applications in electronic device characteristic modeling have become increasingly evident. This study proposes a high-precision modeling and validation method for electronic device characteristics based on machine learning, replacing traditional modeling approaches with a data-driven paradigm. The research covers data collection and preprocessing, model selection and optimization, as well as validation framework design and performance evaluation. Experimental results demonstrate that machine learning models significantly outperform traditional methods in terms of prediction accuracy and generalization ability, especially when handling complex multi-variable relationships and nonlinear characteristics. Furthermore, this study explores the engineering potential of this approach and proposes future directions, such as large-scale data integration and multimodal modeling. These findings offer new technical pathways and tools for electronic device design and optimization.
Authors
- Shutong Huo (ORCID: https://orcid.org/0000-0002-7893-8037)
- Guang‐Feng Zuo (ORCID: https://orcid.org/0000-0002-9589-6035)
- Jiaju Jiang
- Yuxiang Ma (ORCID: https://orcid.org/0000-0001-8538-6309)
- Lei Yao (ORCID: https://orcid.org/0009-0005-3170-6553)
- Juntao Zhang
Institutions
- Xi'an Polytechnic University (CN)
Publication Details
- Published
- 2025-01-10
- DOI
- https://doi.org/10.1109/citsc64390.2025.00041
- Primary Topic
- Industrial Vision Systems and Defect Detection
- Type
- article
- Field-Weighted Citation Impact
- 0.00