Optimization of Multi-Beam Depth Survey Line Design Based on Monte Carlo Method
Multi-beam depth measurement can transmit multiple beams simultaneously and measure wide, fully covered water depth bands, breaking the limitations of single beam depth measurement. However, due to differences in the average overlap of the bands, there may be missed measurements or data redundancy in deep water areas. Therefore, it is necessary to optimize the design of multi-beam depth survey lines. This paper explores the issue of different sea areas such as submarine slopes, and mainly designs a coverage width model for multi-beam depth measurement, an overlap rate model between adjacent bands, and an optimization method for the survey line design on geometric relationships.
Authors
- Wei-Tao Liu (ORCID: https://orcid.org/0000-0003-0566-671X)
- Yangguang Li (ORCID: https://orcid.org/0000-0003-3096-6159)
- Jiang Shen
Institutions
- Chang'an University (CN)
Publication Details
- Published
- 2025-01-10
- DOI
- https://doi.org/10.1109/citsc64390.2025.00029
- Primary Topic
- Advanced Numerical Analysis Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00