Multiangle lensless imaging based on spatial correlation

X-ray diffraction imaging is a powerful tool for exploring microscopic structures. However, conventional x-ray diffraction imaging using synchrotron radiation relies on high-brilliance sources, which hinders its wide application in laboratory scenarios. Here we propose a multiangle lensless imaging method that allows for the simultaneous measurement of the sample's Fourier information from different angles. The Fourier-transform diffraction pattern of the sample can be obtained through spatial correlation calculation. Benefiting from the multiangle strategy, a significant improvement in the quality of the diffraction pattern can be achieved. In proof-of-concept simulations, we have successfully extracted the sample's Fourier information and retrieved its spatial distribution with a radiation flux as low as 1 photon/${\mathrm{mrad}}^{2}\text{s}$. Our research may enrich the panel of laboratory-based x-ray diffraction imaging techniques.