Novel Learning Framework with Generative AI X-Ray Images for Deep Neural Network-Based X-Ray Security Inspection of Prohibited Items Detection with You Only Look Once
As the rapid expansion of future mobility systems increases, along with the demand for fast and accurate X-ray security inspections, deep neural network (DNN)-based systems have gained significant attention for detecting prohibited items by constructing high-quality datasets and enhancing detection performance. While Generative AI has been widely explored across various fields, its application in DNN-based X-ray security inspection remains largely underexplored. The accessibility of commercial Generative AI raises safety concerns about the creation of new prohibited items, highlighting the need to integrate synthetic X-ray images into DNN training to improve detection performance, adapt to emerging threats, and investigate its impact on object detection. To address this, we propose a novel machine learning framework that enhances DNN-based X-ray security inspection by integrating real-world X-ray images with Generative AI images utilizing a commercial text-to-image model, improving dataset diversity and detection accuracy. Our proposed framework provides an effective solution to mitigate potential security threats posed by Generative AI, significantly improving the reliability of DNN-based X-ray security inspection systems, as verified through comprehensive evaluations.
Authors
- Jinho Kang (ORCID: https://orcid.org/0000-0003-2513-3304)
- Dong‐Sik Kim (ORCID: https://orcid.org/0000-0002-0608-1580)
Institutions
- Gyeongsang National University (KR)
Publication Details
- Journal
- Electronics
- Published
- 2025-03-28
- DOI
- https://doi.org/10.3390/electronics14071351
- Citations
- 3
- Primary Topic
- Advanced Neural Network Applications
- Type
- article
- Field-Weighted Citation Impact
- 3.83
Funders
- National Research Foundation of Korea