Applying AI in Supporting Additive Manufacturing Machine Maintenance

Abstract Based on recent Artificial Intelligence advancements, this paper addresses implementing an AI-based maintenance strategy within a controlled production environment. The architecture employs real-time machine monitoring. Data is first processed locally for early fault detection and later cloud-based to support predictive maintenance functions. A Large Language Model trained with domain-specific knowledge provides operators with basic instructions to manage repetitive faults. The architecture is implemented and tested as a source of experimental data.

Authors

Publication Details

Journal
Zeitschrift für wirtschaftlichen Fabrikbetrieb
Published
2025-03-20
DOI
https://doi.org/10.1515/zwf-2024-0169
Citations
1
Primary Topic
Industrial Vision Systems and Defect Detection
Type
article
Field-Weighted Citation Impact
1.24
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article

Applying AI in Supporting Additive Manufacturing Machine Maintenance

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1 citations
Zeitschrift für wirtschaftlichen Fabrikbetrieb
Industrial Vision Systems and Defect Detection
1.24
article

Applying AI in Supporting Additive Manufacturing Machine Maintenance

Eduardo Zancul, Eckhard Kirchner, Luiz Fernando C. S. Durão, Florian Schmitt, Denilton Donizetti Silva, Júlio César R. A. Paz
article en
1 citations

Abstract

Abstract Based on recent Artificial Intelligence advancements, this paper addresses implementing an AI-based maintenance strategy within a controlled production environment. The architecture employs real-time machine monitoring. Data is first processed locally for early fault detection and later cloud-based to support predictive maintenance functions. A Large Language Model trained with domain-specific knowledge provides operators with basic instructions to manage repetitive faults. The architecture is implemented and tested as a source of experimental data.

Zeitschrift für wirtschaftlichen FabrikbetriebVol. 120(s1)
Industry, innovation and infrastructure
Openalex Percentile: Top 21%
Industrial Vision Systems and Defect Detection
1.24
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