<i>In situ</i> NAP-XPS study of plasma-enhanced silver oxidation and reduction reactions

Near ambient pressure-x-ray photoelectron spectroscopy (NAP-XPS) is a less traditional form of XPS that allows samples to be analyzed at relatively high pressures, i.e., at greater than 5000 Pa. NAP-XPS can probe moderately volatile liquids, biological samples, porous materials, and polymeric materials that outgas significantly. In this submission, we show the survey, Ag 3d, C 1s, and O 1s NAP-XPS spectra of a polycrystalline silver sample exposed in situ to different plasma conditions during the analysis. The measurements were performed operando, during plasma treatments at 5 Pa, both in ambient air and in forming gas, a mixture containing 5% hydrogen and 95% nitrogen.

Authors

Publication Details

Journal
Surface Science Spectra
Published
2025-03-27
DOI
https://doi.org/10.1116/6.0004223
Citations
6
Primary Topic
Electron and X-Ray Spectroscopy Techniques
Type
article
Field-Weighted Citation Impact
3.97
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article

In situ NAP-XPS study of plasma-enhanced silver oxidation and reduction reactions

Andreas Thißen, Paul Dietrich
6 citations
Surface Science Spectra
Electron and X-Ray Spectroscopy Techniques
3.97
article

In situ NAP-XPS study of plasma-enhanced silver oxidation and reduction reactions

Andreas Thißen, Paul Dietrich
article en
6 citations

Abstract

Near ambient pressure-x-ray photoelectron spectroscopy (NAP-XPS) is a less traditional form of XPS that allows samples to be analyzed at relatively high pressures, i.e., at greater than 5000 Pa. NAP-XPS can probe moderately volatile liquids, biological samples, porous materials, and polymeric materials that outgas significantly. In this submission, we show the survey, Ag 3d, C 1s, and O 1s NAP-XPS spectra of a polycrystalline silver sample exposed in situ to different plasma conditions during the analysis. The measurements were performed operando, during plasma treatments at 5 Pa, both in ambient air and in forming gas, a mixture containing 5% hydrogen and 95% nitrogen.

Surface Science SpectraVol. 32(1)
Openalex Percentile: Top 7%
Electron and X-Ray Spectroscopy Techniques
3.97
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