Chemical Mapping of Supramolecular Self-Assembled Monolayers via Atomic Force Microscopy-Based Infrared with a Nanometer-Scale Lateral Resolution
Atomic force microscopy-based infrared (AFM-IR) techniques have long enabled chemical imaging of surfaces with spatial resolutions down to 10 nm. In this study, we push the boundaries of AFM-IR spatial resolution to the single-nanometer scale, achieving chemical mapping of supramolecular networks at the submolecular level. This breakthrough is made possible by implementing an innovative tapping-mode AFM-IR approach. Such unprecedented resolution opens new horizons for advancements in nanoscience.
Authors
- Chunzeng Li
- Alexandre Dazzi (ORCID: https://orcid.org/0000-0001-5752-8461)
- Jérémie Mathurin (ORCID: https://orcid.org/0000-0002-6769-6394)
- Vincent Luzet (ORCID: https://orcid.org/0009-0006-3963-6753)
- Frédéric Chérioux (ORCID: https://orcid.org/0000-0002-2906-0766)
- Frank Palmino (ORCID: https://orcid.org/0000-0003-4527-9570)
- Cassandra Phillips (ORCID: https://orcid.org/0000-0003-0370-7493)
- Ariane Deniset‐Besseau (ORCID: https://orcid.org/0000-0002-1923-4988)
- Peter Wolf (ORCID: https://orcid.org/0000-0002-7408-2921)
- Qichi Hu
Institutions
- Bruker (United States) (US)
- Université Paris-Saclay (FR)
- Franche-Comté Électronique Mécanique Thermique et Optique - Sciences et Technologies (FR)
- Institut de Chimie (FR)
- Bruker (Switzerland) (CH)
- Université de Franche-Comté (FR)
Publication Details
- Journal
- The Journal of Physical Chemistry Letters
- Published
- 2025-03-27
- DOI
- https://doi.org/10.1021/acs.jpclett.5c00360
- Citations
- 6
- Primary Topic
- Force Microscopy Techniques and Applications
- Type
- article
- Field-Weighted Citation Impact
- 7.48
Funders
- Agence Nationale de la Recherche
- Conseil Régional, Île-de-France