Low‐Temperature Controlled Growth of 2D LaOCl with Enhanced Dielectric Properties for Advanced Electronics
Abstract 2D semiconductors are widely regarded as the future of highly integrated circuits, but their commercialization is hindered by the lack of suitable gate dielectrics that meet stringent performance and processing requirements. In this study, a novel LiNO₃‐assisted Confined Flux Growth (CFG) method is presented that enables the synthesis of high‐quality 2D LaOCl nanosheets at remarkably low temperatures (250–350 °C). The synthesized LaOCl not only shows an exciting coexistence of wide bandgap (≈5.54 eV) and high dielectric constant (≈13.8) but also can form high‐quality van der Waals interfaces with 2D semiconductors. Compared to traditional methods, the CFG approach significantly reduces thermal budget, providing opportunities for facile integration with the traditional semiconductor industry. Furthermore, the multifunctional application of LaOCl is demonstrated in 2D transistors. The MoS₂ field‐effect transistors (FET) gated by LaOCl exhibit excellent gate control (on/off ratio >10⁸) and low interfacial trap density. The floating‐gate devices with LaOCl as the tunneling layer show an extremely large storage window (≈91%) and stable storage characteristics. These findings establish 2D LaOCl as a transformative dielectric material, paving the way for next‐generation multifunctional 2D electronic devices.
Authors
- Chuanyong Jian (ORCID: https://orcid.org/0000-0001-6504-8652)
- Zhipeng Fu
- Wei Liu (ORCID: https://orcid.org/0000-0001-9925-063X)
- Yixiang Li (ORCID: https://orcid.org/0000-0002-0231-7453)
- Yao Yu
- Qian Cai (ORCID: https://orcid.org/0000-0002-5700-3275)
- Jiashuai Yuan
Institutions
- Chinese Academy of Sciences (CN)
- Fujian Institute of Research on the Structure of Matter (CN)
- Tan Kah Kee Innovation Laboratory (CN)
- University of Chinese Academy of Sciences (CN)
- Fuzhou University (CN)
Publication Details
- Journal
- Advanced Functional Materials
- Published
- 2025-03-25
- DOI
- https://doi.org/10.1002/adfm.202501136
- Citations
- 10
- Primary Topic
- Electronic and Structural Properties of Oxides
- Type
- article
- Field-Weighted Citation Impact
- 5.18
Funders
- National Natural Science Foundation of China
- Chinese Academy of Sciences