Design of 8T SRAM Cell Using Transmission Gates

Around 70% of the power consumed and area occupied on a silicon die is due to SRAMs, which also take up about 70% of the total die space. This design provides a lower footprint, reduced latency, less expenditure of power, and increased data stability during read operations. System on Chips (SoCs) heavily relies on SRAMs, which usually take up about 70% of the total area of the die. This leaves room for potential expansion in the future. The usage of SRAMs has resulted in higher power demand, which can be addressed to the growth in the number of transistors and the associated leakage current that comes along with these transistors in smaller technologies.

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Publication Details

Journal
International Journal of Scientific Research in Computer Science Engineering and Information Technology
Published
2025-03-25
DOI
https://doi.org/10.32628/cseit25112727
Primary Topic
VLSI and Analog Circuit Testing
Type
article
Field-Weighted Citation Impact
0.00
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article

Design of 8T SRAM Cell Using Transmission Gates

Aditya Kulkarni, S Sunitha, M Lohan, Shashank G Kubasad et al.
International Journal of Scientific Research in Computer Science Engineering and Information Technology
VLSI and Analog Circuit Testing
article

Design of 8T SRAM Cell Using Transmission Gates

Aditya Kulkarni, S Sunitha, M Lohan, Shashank G Kubasad, Shriparna
article en

Abstract

Around 70% of the power consumed and area occupied on a silicon die is due to SRAMs, which also take up about 70% of the total die space. This design provides a lower footprint, reduced latency, less expenditure of power, and increased data stability during read operations. System on Chips (SoCs) heavily relies on SRAMs, which usually take up about 70% of the total area of the die. This leaves room for potential expansion in the future. The usage of SRAMs has resulted in higher power demand, which can be addressed to the growth in the number of transistors and the associated leakage current that comes along with these transistors in smaller technologies.

International Journal of Scientific Research in Computer Science Engineering and Information TechnologyVol. 11(2)
Central Manufacturing Technology Institute (IN)
Openalex Percentile: Top 95%
VLSI and Analog Circuit Testing
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