Feasibility of Nano Electrical Resistive Tomography for Subsurface Atomic Force Microscopy

This article investigates the feasibility of using a dual-cantilever atomic force microscope for imaging the electrical properties of a sample below the surface. Principles from macro-scale electrical resistive tomography are adapted to utilize measurements from a dual-probe atomic force microscope. A deep-learning method is employed to perform the inversion process and construct the tomography. Simulation results demonstrate that electrical resistive tomography is possible at the nanometre scale but improvements to the inversion algorithms are needed before moving to experimental applications.