Equivalent Circuit Model for Simulating ESD Discharge Current in ESD Damage Test

Electrostatic discharge (ESD) damage evaluation methods for common mode choke (CMC) and ESD suppression devices are standardized in IEC 62228-5 Annex E and Annex F, respectively. The significant challenge associated with these tests is the difficulty in measuring the current waveform flowing through the input section of a device under test (DUT) and predicting the current in advance. In this study, we investigated an equivalent circuit model that enables prediction of the discharge current waveform flowing through the DUT in advance using SPICE without measurements. Specifically, we developed an equivalent circuit model consisting of a test board and an ESD gun for LTspice, and subsequently confirmed the validity of the model by comparing the measured output voltage waveforms of the test board with simulated ones. As a result, the simulation circuit model predicts the discharge current through the DUTs and their connected circuit within about 10–30% difference in the first peak voltage and rise time. While there is room for improvement in simulation accuracy from various perspectives, such as the test board and the ESD gun model, this suggests that the simulation circuit model is effective and that the approximate current waveform flowing through the CMC and ESD suppression devices can be predicted by circuit simulation without measurement.

Authors

Institutions

Publication Details

Journal
IEICE Transactions on Communications
Published
2025-03-26
DOI
https://doi.org/10.23919/transcom.2024mcp0009
Primary Topic
Electrostatic Discharge in Electronics
Type
article
Field-Weighted Citation Impact
0.00
Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

Equivalent Circuit Model for Simulating ESD Discharge Current in ESD Damage Test

Yusuke Yano, Jianqing Wang, H. Ito, S. Ishihara
IEICE Transactions on Communications
Electrostatic Discharge in Electronics
article

Equivalent Circuit Model for Simulating ESD Discharge Current in ESD Damage Test

Yusuke Yano, Jianqing Wang, H. Ito, S. Ishihara
article en

Abstract

Electrostatic discharge (ESD) damage evaluation methods for common mode choke (CMC) and ESD suppression devices are standardized in IEC 62228-5 Annex E and Annex F, respectively. The significant challenge associated with these tests is the difficulty in measuring the current waveform flowing through the input section of a device under test (DUT) and predicting the current in advance. In this study, we investigated an equivalent circuit model that enables prediction of the discharge current waveform flowing through the DUT in advance using SPICE without measurements. Specifically, we developed an equivalent circuit model consisting of a test board and an ESD gun for LTspice, and subsequently confirmed the validity of the model by comparing the measured output voltage waveforms of the test board with simulated ones. As a result, the simulation circuit model predicts the discharge current through the DUTs and their connected circuit within about 10–30% difference in the first peak voltage and rise time. While there is room for improvement in simulation accuracy from various perspectives, such as the test board and the ESD gun model, this suggests that the simulation circuit model is effective and that the approximate current waveform flowing through the CMC and ESD suppression devices can be predicted by circuit simulation without measurement.

IEICE Transactions on CommunicationsVol. E108-B(9)
Nagoya Institute of Technology (JP)
Openalex Percentile: Top 95%
Electrostatic Discharge in Electronics
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.