A 71.5-dB SNDR 475-MS/s Ringamp-Based Pipelined SAR ADC With On-Chip Bit-Weight Calibration
This article presents a single-channel 13-bit pipelined successive-approximation register (SAR) analog-to-digital converter (ADC). To achieve energy-efficient residue amplification, a ring amplifier (ringamp) with optimized biasing and common-mode feedback (CMFB) is utilized. The inter-stage gain and digital-to-analog converter (DAC) mismatch are calibrated by leveraging the proposed auxiliary-latch-based comparison-threshold dithering (CTD) and separate-averaging algorithm. This calibration achieves fast convergence, requiring only 4096 dither-injected samples for background gain-error correction. Fabricated in a 22-nm CMOS process, the ADC consumes 9.93 mW at 475 MS/s and achieves a peak signal-to-noise-and-distortion ratio (SNDR) of 71.5 dB, yielding a Schreier figure of merit (FoMS) of 175.3 dB and a Walden figure of merit (FoMW) of 6.8 fJ/conversion-step.
Authors
- Yuan Zhu (ORCID: https://orcid.org/0000-0003-4641-2847)
- Peng Cao (ORCID: https://orcid.org/0000-0001-8735-2989)
- Zhiliang Hong (ORCID: https://orcid.org/0000-0002-9968-5964)
- Jiawei Xu (ORCID: https://orcid.org/0000-0002-4150-0971)
- C. Chen
Institutions
- Fudan University (CN)
Publication Details
- Journal
- IEEE Journal of Solid-State Circuits
- Published
- 2025-03-26
- DOI
- https://doi.org/10.1109/jssc.2025.3551156
- Primary Topic
- CCD and CMOS Imaging Sensors
- Type
- article
- Field-Weighted Citation Impact
- 0.00