A 71.5-dB SNDR 475-MS/s Ringamp-Based Pipelined SAR ADC With On-Chip Bit-Weight Calibration

This article presents a single-channel 13-bit pipelined successive-approximation register (SAR) analog-to-digital converter (ADC). To achieve energy-efficient residue amplification, a ring amplifier (ringamp) with optimized biasing and common-mode feedback (CMFB) is utilized. The inter-stage gain and digital-to-analog converter (DAC) mismatch are calibrated by leveraging the proposed auxiliary-latch-based comparison-threshold dithering (CTD) and separate-averaging algorithm. This calibration achieves fast convergence, requiring only 4096 dither-injected samples for background gain-error correction. Fabricated in a 22-nm CMOS process, the ADC consumes 9.93 mW at 475 MS/s and achieves a peak signal-to-noise-and-distortion ratio (SNDR) of 71.5 dB, yielding a Schreier figure of merit (FoMS) of 175.3 dB and a Walden figure of merit (FoMW) of 6.8 fJ/conversion-step.

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Publication Details

Journal
IEEE Journal of Solid-State Circuits
Published
2025-03-26
DOI
https://doi.org/10.1109/jssc.2025.3551156
Primary Topic
CCD and CMOS Imaging Sensors
Type
article
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article

A 71.5-dB SNDR 475-MS/s Ringamp-Based Pipelined SAR ADC With On-Chip Bit-Weight Calibration

Yuan Zhu, Peng Cao, Zhiliang Hong, Jiawei Xu et al.
IEEE Journal of Solid-State Circuits
CCD and CMOS Imaging Sensors
article

A 71.5-dB SNDR 475-MS/s Ringamp-Based Pipelined SAR ADC With On-Chip Bit-Weight Calibration

Yuan Zhu, Peng Cao, Zhiliang Hong, Jiawei Xu, C. Chen
article en

Abstract

This article presents a single-channel 13-bit pipelined successive-approximation register (SAR) analog-to-digital converter (ADC). To achieve energy-efficient residue amplification, a ring amplifier (ringamp) with optimized biasing and common-mode feedback (CMFB) is utilized. The inter-stage gain and digital-to-analog converter (DAC) mismatch are calibrated by leveraging the proposed auxiliary-latch-based comparison-threshold dithering (CTD) and separate-averaging algorithm. This calibration achieves fast convergence, requiring only 4096 dither-injected samples for background gain-error correction. Fabricated in a 22-nm CMOS process, the ADC consumes 9.93 mW at 475 MS/s and achieves a peak signal-to-noise-and-distortion ratio (SNDR) of 71.5 dB, yielding a Schreier figure of merit (FoMS) of 175.3 dB and a Walden figure of merit (FoMW) of 6.8 fJ/conversion-step.

IEEE Journal of Solid-State CircuitsVol. 60(10)
Fudan University (CN)
Affordable and clean energy
Openalex Percentile: Top 95%
CCD and CMOS Imaging Sensors
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