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Atomically thin films and surfaces exhibit many distinctive two-dimensional electronic properties that are absent in bulk crystals. microscale multiprobe measurements have been utilized as an effective method to identify the electrical conductivity of such thin films and surfaces. Precise determination of multiprobe positions is crucial for accurate characterization of the conductance. However, traditional methods that use microscopes for determining multiprobe positions often impose significant constraints on experimental setups. In some cases, installing a microscope is not even feasible. Therefore, in this study, we propose a novel method to determine probe positions using electrical signals from the probes. This method enables precise determination of probe positions using a reference sheet and reference probes, even at low or high temperatures and under ultrahigh-vacuum or high-pressure conditions. The proposed method simplifies the integration of microscale multiprobe measurement systems into various devices, thereby advancing research on thin films and surfaces.