Detailed Characterization of Isolated Single and Half-Bridge Gate Drivers from Room Temperature to Cryogenic Temperatures

This study provides a comprehensive characterization of various isolated single and half-bridge gate drivers over the entire temperature range from room temperature down to −194 °C. Unlike previous studies, which primarily focused on electrical output parameters such as rise/fall times and propagation delays, this paper also explores critical functionalities like undervoltage lockout (UVLO) and common-mode transient immunity (CMTI). The first comprehensive characterization of the power-up and power-down behavior of gate drivers identified critical operating states for practical use. In addition, CMTI testing revealed the premature functional failures of some drivers at low temperatures.