On the selection of broadband monitoring algorithms for optical coating production
Three algorithms for broadband monitoring of optical coating production are compared using computational manufacturing experiments with three fundamentally different optical coating designs. It is shown that for the optimal selection of a broadband monitoring algorithm, it is not enough to consider only the levels of thicknesses errors; it is also necessary to consider the strength of the error self-compensation mechanism. Based on this consideration, recommendations are given for choosing the optimal algorithm for monitoring different types of designs.
Authors
- S. A. Sharapova
- A. G. Yagola (ORCID: https://orcid.org/0000-0001-6942-2138)
- Alexander V. Tikhonravov (ORCID: https://orcid.org/0000-0001-7773-7068)
- A. N. Sharov (ORCID: https://orcid.org/0000-0003-3369-9519)
- Sergey KIRPICHENKO
Institutions
- Lomonosov Moscow State University (RU)
- Moscow Center For Continuous Mathematical Education (RU)
- Applied Multilayers (United Kingdom) (GB)
- Applied Mathematics (United States) (US)
- Moscow State University (TJ)
Publication Details
- Journal
- Optics Express
- Published
- 2025-03-25
- DOI
- https://doi.org/10.1364/oe.559120
- Citations
- 2
- Primary Topic
- Semiconductor Lasers and Optical Devices
- Type
- article
- Field-Weighted Citation Impact
- 1.46