Polarity-dependent effects in silicon carbide crystals: from fundamentals to applications
Abstract Whether in the form of zinc blende, wurtzite, or a composite structure of the two, silicon carbide (SiC) crystals possess a pair of polar crystal faces along the stacking direction of Si–C bilayers, namely the Si-face and the C-face. These two faces have different atomic structures and surface properties, resulting in anisotropic and surface polarity (SP)-dependent effects on growth and mechanical processing of SiC materials and electrical performance of SiC-based devices. Although much effort has been spent on the studies of the SiC polarity and SP-dependent effects, no systematic review of these studies has been reported. Herein, we aim to comprehensively outline the main aspects of the polarity-dependent effects of SiC, starting from the origin of polarity and culminating in a discussion on how SP affects device performance. Along the way, we will cover several methods for identifying SP and SP-dependent effects on crystal growth, mechanical processing and heteroepitaxy. The particular significance of this study lies in providing a clear research framework and overview that serves as a reference for future research and applications.
Authors
- Gang Xiang (ORCID: https://orcid.org/0000-0002-5060-975X)
- Hongfeng Lin
- Xi Zhang (ORCID: https://orcid.org/0000-0002-4823-9120)
- Yuan Huang (ORCID: https://orcid.org/0000-0002-9548-0208)
Institutions
- Sichuan University (CN)
- Chengdu Organic Chemicals (China) (CN)
Publication Details
- Journal
- Journal of Physics D Applied Physics
- Published
- 2025-03-24
- DOI
- https://doi.org/10.1088/1361-6463/adc468
- Citations
- 1
- Primary Topic
- Silicon Carbide Semiconductor Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.73
Funders
- National Natural Science Foundation of China