Editorial for the Special Issue on Large Scale Assessment: Challenges and Innovations
This editorial introduces the IEJEE’s Special Issue on Large Scale Assessment: Challenges and Innovations, highlighting emerging themes and methodological advancements in educational measurement. The selected studies focus on process data utilization to examine test-taker behavior, innovations in psychometric modeling for assessment, classification, and the influence of social-emotional learning on academic achievement. This editorial discusses the contributions of the included studies, their implications for future research, and the evolving role of AI, machine learning, and digital assessment technologies in shaping the future of large-scale assessments.
Authors
- Ummugul Bezirhan (ORCID: https://orcid.org/0000-0002-8771-4780)
- Murat Doğan Şahin (ORCID: https://orcid.org/0000-0002-2174-8443)
Publication Details
- Journal
- lnternational Electronic Journal of Elementary Education
- Published
- 2025-03-19
- DOI
- https://doi.org/10.26822/iejee.2025.381
- Primary Topic
- Higher Education Learning Practices
- Type
- article
- Field-Weighted Citation Impact
- 0.00