Junction Temperature Estimation Model of Power MOSFET Device Based on Photovoltaic Power Enhancer
In a photovoltaic power enhancer system, when it is operated in current-control mode, significant nonuniform temperature distribution occurs in the converter due to thermal coupling effects, dissipative boundary conditions, and differences in device losses within the in-phase bridge. Accurate on-site estimation of the power device’s junction temperature is critical in the system design. To address this problem, a novel thermal behavior estimation model based on electro-thermal analysis is proposed in this paper, which can be used for asymmetric power MOSFETs in a photovoltaic power enhancer system. Thermal coupling effects and dissipative boundary conditions are, firstly, analyzed in a three-dimensional finite element model. A coupling impedance matrix is constructed through step power response extraction to describe the significant thermal coupling effects among devices. The complete heat sink is decoupled into several sub-parts representing different dissipative boundary conditions. A compact RC network model for estimating junction temperature is established based on the combination of the coupling impedance and the sub-heat-sink impedance. The proposed model is verified by finite element simulation and experimental measurement.
Authors
- Shubin Zhang (ORCID: https://orcid.org/0000-0001-9075-8701)
- Yanfeng Jiang (ORCID: https://orcid.org/0000-0002-5006-5190)
- Ning Li (ORCID: https://orcid.org/0000-0003-0856-3062)
Institutions
- Jiangnan University (CN)
Publication Details
- Journal
- Journal of Low Power Electronics and Applications
- Published
- 2025-03-24
- DOI
- https://doi.org/10.3390/jlpea15020017
- Citations
- 1
- Primary Topic
- Thin-Film Transistor Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.73