Development of an innovative low-temperature PEALD process for stress-compensated TiO2 and SiO2 multilayer anti-reflective coatings

This study presents a low-temperature plasma-enhanced atomic layer deposition (PEALD) technique for fabricating high-performance, stress-reduced anti-reflective coatings (ARCs). To the best of our knowledge, this is the first extensive study on titanium dioxide (TiO<sub>2</sub>)/silicon dioxide (SiO<sub>2</sub>) stacking with PEALD at such a low temperature of 70 °C, which may help to overcome high-temperature deposition issues and mechanical stress for polymer substrates. Despite the presence of impurities in the low-temperature deposited films, the measured extinction coefficient (k < 10<sup>-4</sup>) indicates negligible optical absorption in both TiO<sub>2</sub> and SiO<sub>2</sub> layers, ensuring optimal performance for ARCs. Stress compensation is observed between tensile TiO<sub>2</sub> films (≈ 220 MPa) and compressive SiO<sub>2</sub> films (≈ - 35 MPa). For multi-layer ARCs, this combination strategy leads to a very low total stress of 48 MPa, which is a big step forward for stress control in optical coatings. This stress-reduction effect remains effective even when the thickness difference reaches up to 9.6%. This consistency has been demonstrated in real-world applications, where achieving an ideal level of thinness can be challenging. The optimized process at 150 W plasma power produces high-quality optics with an average reflectivity of 0.35% in the visible range while maintaining low stress, a significant achievement in low temperature deposited optical coatings. The choice of common, cost-effective materials like SiO<sub>2</sub> and TiO<sub>2</sub> makes this approach easily scalable for industrial use and can see the future of manufacturing ARCs for various applications. These films are characterized by a low density of defects and an amorphous structure with the smoothness of their surface being close to one atomic monolayer (≈ 0.2 nm), which indicates their high optical quality, comparable to films deposited at high temperatures. The low-temperature PEALD presented in this work not only pushes the boundary in advanced optical coatings but also enlarges the capacity in coating temperature-sensitive substrates and complex 3D structures. This innovation paves the way for applications in bendable electronics, high-performance optical components, and next generation display devices.

Authors

Institutions

Publication Details

Journal
Discover Nano
Published
2025-03-24
DOI
https://doi.org/10.1186/s11671-025-04238-2
Citations
4
Primary Topic
Semiconductor materials and devices
Type
article
Field-Weighted Citation Impact
2.92
Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

Development of an innovative low-temperature PEALD process for stress-compensated TiO2 and SiO2 multilayer anti-reflective coatings

Chao-Te Lee, Kuan-Yu Ko, Meng-Chi Li, Chien-Cheng Kuo et al.
4 citations
Discover Nano
Semiconductor materials and devices
2.92
article

Development of an innovative low-temperature PEALD process for stress-compensated TiO2 and SiO2 multilayer anti-reflective coatings

Chao-Te Lee, Kuan-Yu Ko, Meng-Chi Li, Chien-Cheng Kuo, Wen-Hao Cho, Duy Thanh Cu
article en
4 citations

Abstract

This study presents a low-temperature plasma-enhanced atomic layer deposition (PEALD) technique for fabricating high-performance, stress-reduced anti-reflective coatings (ARCs). To the best of our knowledge, this is the first extensive study on titanium dioxide (TiO<sub>2</sub>)/silicon dioxide (SiO<sub>2</sub>) stacking with PEALD at such a low temperature of 70 °C, which may help to overcome high-temperature deposition issues and mechanical stress for polymer substrates. Despite the presence of impurities in the low-temperature deposited films, the measured extinction coefficient (k < 10<sup>-4</sup>) indicates negligible optical absorption in both TiO<sub>2</sub> and SiO<sub>2</sub> layers, ensuring optimal performance for ARCs. Stress compensation is observed between tensile TiO<sub>2</sub> films (≈ 220 MPa) and compressive SiO<sub>2</sub> films (≈ - 35 MPa). For multi-layer ARCs, this combination strategy leads to a very low total stress of 48 MPa, which is a big step forward for stress control in optical coatings. This stress-reduction effect remains effective even when the thickness difference reaches up to 9.6%. This consistency has been demonstrated in real-world applications, where achieving an ideal level of thinness can be challenging. The optimized process at 150 W plasma power produces high-quality optics with an average reflectivity of 0.35% in the visible range while maintaining low stress, a significant achievement in low temperature deposited optical coatings. The choice of common, cost-effective materials like SiO<sub>2</sub> and TiO<sub>2</sub> makes this approach easily scalable for industrial use and can see the future of manufacturing ARCs for various applications. These films are characterized by a low density of defects and an amorphous structure with the smoothness of their surface being close to one atomic monolayer (≈ 0.2 nm), which indicates their high optical quality, comparable to films deposited at high temperatures. The low-temperature PEALD presented in this work not only pushes the boundary in advanced optical coatings but also enlarges the capacity in coating temperature-sensitive substrates and complex 3D structures. This innovation paves the way for applications in bendable electronics, high-performance optical components, and next generation display devices.

Discover NanoVol. 20(1)
Ming Chi University of Technology (TW), National Central University (TW), National Institutes of Applied Research (TW)
Affordable and clean energy
Openalex Percentile: Top 10%
Semiconductor materials and devices
2.92
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.