Surface Resistance Measurement Using Cavity Resonator: <i>x</i> <3-dB Bandwidth Method
In conventional surface resistance <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$R_{s}$ </tex-math></inline-formula> measurement using cavity resonator, the 3-dB bandwidth method is frequently used for quality factor (Q-factor) extraction, in which the swept frequency bandwidth should be multiple of 3-dB bandwidth. However, sometimes, it is unable to measure resonator whose measurable bandwidth is smaller than 3 dB. Here, an x-dB bandwidth method is studied for Q-factor extraction and its feasibility is demonstrated by <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$R_{s}$ </tex-math></inline-formula> measurements with a TE011 mode cylindrical cavity resonator and a quasi-optical cavity.
Authors
- Xueer Wang (ORCID: https://orcid.org/0009-0002-3592-4847)
- Ming Ye (ORCID: https://orcid.org/0000-0002-9614-0870)
- Feng Xu (ORCID: https://orcid.org/0000-0001-7727-0488)
- Yongjun Xie (ORCID: https://orcid.org/0000-0002-8345-1776)
- Ting Liu (ORCID: https://orcid.org/0000-0002-7600-0934)
Institutions
- Xi'an University of Architecture and Technology (CN)
- Shanghai Academy of Spaceflight Technology (CN)
- Beihang University (CN)
- Xi'an Jiaotong University (CN)
Publication Details
- Journal
- IEEE Microwave and Wireless Technology Letters
- Published
- 2025-03-24
- DOI
- https://doi.org/10.1109/lmwt.2025.3550550
- Primary Topic
- Semiconductor Lasers and Optical Devices
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- National Natural Science Foundation of China