Non-destructive measurement of the charge transfer across LaMnO3/SrTiO3 interfaces
Local polarization and charge transfer at the interface between 7-unit cell-thick LaMnO3 (LMO) ultrathin films and substrates composed of Nb-doped (0.05 wt. %) and undoped SrTiO3 (STO) are examined by resonant surface x-ray diffraction. Notably, this photon-in photon-out technique allows us to simultaneously examine the valence distribution and local polarization with minimal radiation damage. Consistent with previous reports, Mn2+ is observed at the interface. Furthermore, the degree of charge transfer is nearly unchanged by the 0.05 wt. % of Nb doping. In the middle of the LMO films, the valence of Mn is 3+. Local polarization estimated from the cation/anion displacements shows that the electric field points outward in the LMO films, and polarization is suppressed in the STO substrate region.
Authors
- Hiroshi Kumigashira (ORCID: https://orcid.org/0000-0003-4668-2695)
- Miho Kitamura (ORCID: https://orcid.org/0000-0002-9961-9019)
- Yusuke Wakabayashi (ORCID: https://orcid.org/0000-0003-3107-0338)
- Masato Anada
- Kazuki Nagai
- Yuta Ishii (ORCID: https://orcid.org/0000-0002-8957-5833)
- Shohei Miyagawa
Institutions
- Tohoku University (JP)
- National Institute for Materials Science (JP)
- National Institutes for Quantum Science and Technology (JP)
- The University of Osaka (JP)
Publication Details
- Journal
- Journal of Applied Physics
- Published
- 2025-03-24
- DOI
- https://doi.org/10.1063/5.0258175
- Citations
- 1
- Primary Topic
- Electronic and Structural Properties of Oxides
- Type
- article
- Field-Weighted Citation Impact
- 0.52
Funders
- Japan Society for the Promotion of Science London