High-speed integrated optical transceivers for ultra-high modulation data rates in different optical communication applications

Abstract This article has clarified high-speed integrated optical transceivers for ultra-high modulation data rates in different optical communication applications. The total APD and PIN photodiode responsitivity performance signature is indicated in relation to temperature variations for various operating wavelengths. APD/PIN photodiode signal per noise ratio is measured versus the operating spectral wavelength at both room thermal effects and at high thermal effects. Various photodiodes quantum efficiency performance signature are clarified against temperature variations for various operating wavelengths. The total APD and PIN photodiodes sensitivity performance signature is demonstrated versus temperature variations for various operating wavelengths. Various light sources are tested with single mode step index/graded index fiber channel and various light detectors.

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Publication Details

Journal
Journal of Optical Communications
Published
2025-03-24
DOI
https://doi.org/10.1515/joc-2025-0031
Citations
1
Primary Topic
Advanced Photonic Communication Systems
Type
article
Field-Weighted Citation Impact
0.73
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High-speed integrated optical transceivers for ultra-high modulation data rates in different optical communication applications

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1 citations
Journal of Optical Communications
Advanced Photonic Communication Systems
0.73
article

High-speed integrated optical transceivers for ultra-high modulation data rates in different optical communication applications

Shehabeldin Mohamed Saber, R. Thandaiah Prabu, T. Subha, Kavitha Subramaniam, Arulanantham Dhandapani, Bala Ramachandran, Manimaraboopathy Maruthu Pandian
article en
1 citations

Abstract

Abstract This article has clarified high-speed integrated optical transceivers for ultra-high modulation data rates in different optical communication applications. The total APD and PIN photodiode responsitivity performance signature is indicated in relation to temperature variations for various operating wavelengths. APD/PIN photodiode signal per noise ratio is measured versus the operating spectral wavelength at both room thermal effects and at high thermal effects. Various photodiodes quantum efficiency performance signature are clarified against temperature variations for various operating wavelengths. The total APD and PIN photodiodes sensitivity performance signature is demonstrated versus temperature variations for various operating wavelengths. Various light sources are tested with single mode step index/graded index fiber channel and various light detectors.

Journal of Optical Communications
Vel Tech Rangarajan Dr. Sagunthala R&D Institute of Science and Technology (IN), Dr. M.G.R. Educational and Research Institute (IN), Tanta University (EG), R.M.D. Engineering College, Saveetha University (IN)
Openalex Percentile: Top 30%
Advanced Photonic Communication Systems
0.73
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