Measurement System to Determine the Seebeck Coefficient and Electrical Conductivity of Thin Films
Thermoelectric (TE) materials are promising for energy-generating devices, and their design depends on a fast, precise determination of their Seebeck coefficient and electrical conductivity. Herein, a low-cost setup was developed to determine the Seebeck coefficient and electrical conductivity of thin films, allowing the calculation of the power factor (PF) <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$(\text {PF}=S^{2}\sigma)$ </tex-math></inline-formula>. The system was validated by measuring the Seebeck coefficient and electrical conductivity of poly(3,4-ethylenedioxythiophene) polystyrene sulfonate (PEDOT:PSS), a widely used material in organic electronics and TE generators. The results demonstrate the high resolution of our system, with obtained values of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$0.1~\mu \text {V/K}$ </tex-math></inline-formula> for Seebeck coefficient, <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$0.1~\text {S/cm}$ </tex-math></inline-formula> for electrical conductivity, and <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$0.1~\mu \text {W/K}^{2}$ </tex-math></inline-formula> for PF. A detailed description of the fabrication of the measurement setup is provided, with the aim of making thermoelectricity accessible to any research laboratory, even in places with limited budgets.
Authors
- Gustavo G. Dalkiranis (ORCID: https://orcid.org/0000-0001-9590-9249)
- Osvaldo N. Oliveira (ORCID: https://orcid.org/0000-0002-5399-5860)
- A. F. Lopeandía (ORCID: https://orcid.org/0000-0003-0566-8299)
- Gregório Couto Faria (ORCID: https://orcid.org/0000-0001-6138-8473)
- Bruno Bassi Millan Torres (ORCID: https://orcid.org/0000-0001-5999-6488)
- João H. C. Bocchia (ORCID: https://orcid.org/0000-0001-5178-0746)
Institutions
- Universidade Federal de São Carlos (BR)
- Universidade de São Paulo (BR)
- Institute of Physics (PL)
- Institute of Mathematics and Computer Science (MD)
Publication Details
- Journal
- IEEE Transactions on Instrumentation and Measurement
- Published
- 2025-01-01
- DOI
- https://doi.org/10.1109/tim.2025.3553254
- Citations
- 2
- Primary Topic
- High voltage insulation and dielectric phenomena
- Type
- article
- Field-Weighted Citation Impact
- 1.04
Funders
- Fundação de Amparo à Pesquisa do Estado de São Paulo
- Coordenação de Aperfeiçoamento de Pessoal de Nível Superior
- Ministério da Ciência, Tecnologia e Inovação
- Conselho Nacional de Desenvolvimento Científico e Tecnológico
- Instituto Nacional de Ciência e Tecnologia em Eletrônica Orgânica
- Centro Nacional de Pesquisa em Energia e Materiais
- Laboratório Nacional de Nanotecnologia