Development of Low Energy and High Resolution Ultraviolet Photoelectron Spectroscopy Instrument

The fine characterization of electronic structure is a key parameter for aerospace and semiconductor materials performance regulation, and the interaction between ultraviolet light and the material surface is an important influence on the characterization of electronic structure. There is an urgent need to develop the ultraviolet photoelectron spectroscopy instrument. This paper first introduces the ultraviolet photoelectron yield spectroscopy and ultraviolet photoelectron spectroscopy measurement and analysis technology. Based on the continuous adjustable ultraviolet photoelectron yield spectroscopy-energy spectroscopy joint measurement and analysis technology, the low energy and high resolution ultraviolet photoelectron spectroscopy instrument has been designed and developed. The functional debugging and performance testing have also been operated. In the case of the gold material, we examined the electronic structure information, such as its ionization energy and fermi level. The instrument has already realized the electronic structure characterization of metal materials by combining ultraviolet photoelectron spectroscopy (UPS) and ultraviolet photoelectron yield spectroscopy (PYS).

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Published
2024-10-31
DOI
https://doi.org/10.1109/icsmd64214.2024.10920516
Citations
1
Primary Topic
Thin-Film Transistor Technologies
Type
article
Field-Weighted Citation Impact
0.21

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Development of Low Energy and High Resolution Ultraviolet Photoelectron Spectroscopy Instrument

Bohao Tong, Chaobo Zhang, Sichao Zhang, Hisao Ishii et al.
1 citations
Thin-Film Transistor Technologies
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article

Development of Low Energy and High Resolution Ultraviolet Photoelectron Spectroscopy Instrument

Bohao Tong, Chaobo Zhang, Sichao Zhang, Hisao Ishii, Xiaohan Hou, Linhuan Wei, Long Chen, Shuang Wang, Yu Chen, Yali Guo
article en
1 citations

Abstract

The fine characterization of electronic structure is a key parameter for aerospace and semiconductor materials performance regulation, and the interaction between ultraviolet light and the material surface is an important influence on the characterization of electronic structure. There is an urgent need to develop the ultraviolet photoelectron spectroscopy instrument. This paper first introduces the ultraviolet photoelectron yield spectroscopy and ultraviolet photoelectron spectroscopy measurement and analysis technology. Based on the continuous adjustable ultraviolet photoelectron yield spectroscopy-energy spectroscopy joint measurement and analysis technology, the low energy and high resolution ultraviolet photoelectron spectroscopy instrument has been designed and developed. The functional debugging and performance testing have also been operated. In the case of the gold material, we examined the electronic structure information, such as its ionization energy and fermi level. The instrument has already realized the electronic structure characterization of metal materials by combining ultraviolet photoelectron spectroscopy (UPS) and ultraviolet photoelectron yield spectroscopy (PYS).

Chiba University (JP), Xi'an Jiaotong University (CN)
State Key Laboratory of Electrical Insulation and Power Equipment, National Key Research and Development Program of China
Affordable and clean energy
Openalex Percentile: Top 43%
Thin-Film Transistor Technologies
0.21
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