The status and recent updates of the SAO EBIT

Abstract In this report we describe the design and operation of the electron beam ion trap (EBIT) at the Smithsonian Astrophysical Observatory (SAO). We also provide an overview of recent upgrades that have led to improved system stability and greater user control, increasing the scope of possible experiments. Observations of X-ray emission from background elements were made after the system upgrades. The evolution of the spectrum, produced at beam energies ranging from 1285 eV to 3095 eV, allowed us to identify emission from multiple charge states and from key processes, such as dielectronic recombination, in Ba and Si ions. Emission from these background elements was easily removed by periodically dumping the trap every 2 s or less.