Enhancing Noise Robustness in Focus Measure Using Tight Framelet Features
Focus measures are widely used to assess image clarity in various fields, such as photography and computer vision. However, many existing focus measures face challenges in balancing noise robustness and measurement capability. In this letter, a novel focus measure called Variance of Tight Framelet Feature (VTFF) is proposed to address this challenge. VTFF leverages the advantages of tight framelet features and variance information in feature maps to provide a robust and accurate assessment of image focus. Experimental results on both synthetic and real-world data demonstrate its superior performance compared to recent focus measures in measurement capability, noise robustness, and real-time performance.
Authors
- Lixin Shen (ORCID: https://orcid.org/0000-0002-4369-321X)
- Junwei Liu (ORCID: https://orcid.org/0009-0004-9740-9730)
- 則恵 只埜
- Xiaosheng Zhuang (ORCID: https://orcid.org/0000-0001-7238-0143)
- Yan-Ran Li
Institutions
- City University of Hong Kong (HK)
- Shenzhen University (CN)
- Syracuse University (US)
Publication Details
- Journal
- IEEE Signal Processing Letters
- Published
- 2025-01-01
- DOI
- https://doi.org/10.1109/lsp.2025.3553425
- Citations
- 2
- Primary Topic
- Image Processing Techniques and Applications
- Type
- article
- Field-Weighted Citation Impact
- 2.27