Analysis of Spectral Calibration Correction Based on Mie Scattering

Oblique light incidence on a diffuse transmission plate significantly impacts the results in the spectral calibration process. Analysis of the spectrometer's diffraction grating reveals that oblique angles cause uneven energy distribution at the entrance pupil, leading to spectral shifts. This study uses Mie scattering theory to model the diffuse transmission plate and explains the spectral shift, particularly in the infrared region where the plate's micron-scale particles have a pronounced effect. For a 1064nm laser incident at 45° on a 50-micron particle plate, the calculated spectral shifts at 45°, 55°, and 65° are 0.077nm, 0.108nm, and 0.139nm, respectively. Experimental Gaussian-fitted results show actual shifts of 0.044nm, 0.052nm, and 0.085nm. The paper concludes with an analysis of the differences between experimental and theoretical results.

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Published
2024-10-31
DOI
https://doi.org/10.1109/icsmd64214.2024.10920536
Primary Topic
Calibration and Measurement Techniques
Type
article
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article

Analysis of Spectral Calibration Correction Based on Mie Scattering

Xiaohu Yang, Qi Yu, Yu Huang, Zhanfeng Li
Calibration and Measurement Techniques
article

Analysis of Spectral Calibration Correction Based on Mie Scattering

Xiaohu Yang, Qi Yu, Yu Huang, Zhanfeng Li
article en

Abstract

Oblique light incidence on a diffuse transmission plate significantly impacts the results in the spectral calibration process. Analysis of the spectrometer's diffraction grating reveals that oblique angles cause uneven energy distribution at the entrance pupil, leading to spectral shifts. This study uses Mie scattering theory to model the diffuse transmission plate and explains the spectral shift, particularly in the infrared region where the plate's micron-scale particles have a pronounced effect. For a 1064nm laser incident at 45° on a 50-micron particle plate, the calculated spectral shifts at 45°, 55°, and 65° are 0.077nm, 0.108nm, and 0.139nm, respectively. Experimental Gaussian-fitted results show actual shifts of 0.044nm, 0.052nm, and 0.085nm. The paper concludes with an analysis of the differences between experimental and theoretical results.

Chinese Academy of Sciences (CN), Changchun Institute of Optics, Fine Mechanics and Physics (CN), University of Chinese Academy of Sciences (CN)
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Calibration and Measurement Techniques
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