Correlated electronic states in multilayer moire superlattice of transition metal dichalcogenides
Moire superlattices, formed by stacking 2D materials at small twist angles, offer a rich playground to discover new types of electronic states. Spatially resolved electrical probes provide direct access to these states on the mesoscopic scale, complementing conventional techniques. Microwave Impedance Microscopy (MIM) is a new scanning probe microscopy technique that senses materials’ capacitance and conductivity on the nanoscale. In this talk, I will present our studies employing MIM to study correlated electronic states in moiré superlattices of transition metal dichalcogenides (TMD) multilayers. We apply various tuning knobs to manipulate the correlated states and use MIM to probe the conductivity response to characterize the nature of these states. Our results demonstrate the TMD moiré system as a rich platform to explore correlation-enabled electronic phases and showcase the capability of the MIM technique to probe emergent physics in 2D quantum systems.
Authors
- Yong‐Tao Cui (ORCID: https://orcid.org/0000-0002-8015-1049)
Institutions
- University of California, Riverside (US)
Publication Details
- Published
- 2025-03-19
- DOI
- https://doi.org/10.1117/12.3048019
- Primary Topic
- 2D Materials and Applications
- Type
- article
- Field-Weighted Citation Impact
- 0.00