Extending microsphere-assisted microscopy to polarization-driven dynamic laser speckle analysis

Polarimetric imaging is a powerful optical tool for probing material properties by analyzing light polarization effects. However, conventional polarimetric image analysis struggles with addressing complex polarization scenarios due to limitations in disentangling intertwined polarization effects and the detrimental impact of laser-induced speckle. Previously, we proposed combining polarimetric imaging with dynamic laser speckle analysis (DLSA) to overcome these challenges. This synergistic approach focuses on changes in speckle pattern across intensity images acquired during a full polarimetry measurement. Here, we extend this technique into the microscopy domain and enhance the lateral resolution by incorporating microsphere-assisted microscopy (MAM). The integration of these three techniques into a single setup offers a comprehensive approach for applications requiring high-resolution polarimetric analysis.