Modified Si Oxidation Behavior by Ultrathin Ni Catalyst Enabling Oxidant‐Less Metal‐Assisted Chemical Etching (Small 11/2025)
Metal-Assisted Chemical Etching In article number 2409091, Jungwoo Oh and co-workers introduce an innovative metal-assisted chemical etching method using an ultrathin 1 nm nickel catalyst, overcoming limitations of noble metal catalysts in complementary metal-oxide-semiconductor (CMOS) processes. The Ni catalyst enables smooth, deep silicon etching without strong oxidants and supports versatile wafer-scale microstructure fabrication. This CMOS-compatible, cost-efficient approach offers significant potential for semiconductor nanofabrication.
Authors
- Haekyun Bong
- Jungwoo Oh (ORCID: https://orcid.org/0000-0002-6065-6250)
- Kyung Hwan Kim (ORCID: https://orcid.org/0000-0003-1379-800X)
- Sunhae Choi
Institutions
- Yonsei University (KR)
- Korea Institute of Science and Technology (KR)
Publication Details
- Journal
- Small
- Published
- 2025-03-01
- DOI
- https://doi.org/10.1002/smll.202570081
- Primary Topic
- Semiconductor materials and devices
- Type
- article
- Field-Weighted Citation Impact
- 0.00