Modified Si Oxidation Behavior by Ultrathin Ni Catalyst Enabling Oxidant‐Less Metal‐Assisted Chemical Etching (Small 11/2025)

Metal-Assisted Chemical Etching In article number 2409091, Jungwoo Oh and co-workers introduce an innovative metal-assisted chemical etching method using an ultrathin 1 nm nickel catalyst, overcoming limitations of noble metal catalysts in complementary metal-oxide-semiconductor (CMOS) processes. The Ni catalyst enables smooth, deep silicon etching without strong oxidants and supports versatile wafer-scale microstructure fabrication. This CMOS-compatible, cost-efficient approach offers significant potential for semiconductor nanofabrication.

Authors

Institutions

Publication Details

Journal
Small
Published
2025-03-01
DOI
https://doi.org/10.1002/smll.202570081
Primary Topic
Semiconductor materials and devices
Type
article
Field-Weighted Citation Impact
0.00
Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

Modified Si Oxidation Behavior by Ultrathin Ni Catalyst Enabling Oxidant‐Less Metal‐Assisted Chemical Etching (Small 11/2025)

Haekyun Bong, Jungwoo Oh, Kyung Hwan Kim, Sunhae Choi
Small
Semiconductor materials and devices
article

Modified Si Oxidation Behavior by Ultrathin Ni Catalyst Enabling Oxidant‐Less Metal‐Assisted Chemical Etching (Small 11/2025)

Haekyun Bong, Jungwoo Oh, Kyung Hwan Kim, Sunhae Choi
article en

Abstract

Metal-Assisted Chemical Etching In article number 2409091, Jungwoo Oh and co-workers introduce an innovative metal-assisted chemical etching method using an ultrathin 1 nm nickel catalyst, overcoming limitations of noble metal catalysts in complementary metal-oxide-semiconductor (CMOS) processes. The Ni catalyst enables smooth, deep silicon etching without strong oxidants and supports versatile wafer-scale microstructure fabrication. This CMOS-compatible, cost-efficient approach offers significant potential for semiconductor nanofabrication.

SmallVol. 21(11)
Yonsei University (KR), Korea Institute of Science and Technology (KR)
Openalex Percentile: Top 96%
Semiconductor materials and devices
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.