A Re-investigation of Coupled Microstrip Line for Crack Sensing
The paper proposes a crack sensor based on the coupled microstrip line. Cracks alter the coupling coefficient, leading to a shift in the transmission zero of the isolation port. Simulation results demonstrate that the sensor is capable of detecting crack depth.
Authors
- Xuan Xie (ORCID: https://orcid.org/0000-0001-6050-8541)
- Jun Zhang (ORCID: https://orcid.org/0000-0003-1017-7179)
- Tao Liu (ORCID: https://orcid.org/0000-0003-1466-8055)
Institutions
- Guangdong University of Technology (CN)
Publication Details
- Published
- 2024-11-27
- DOI
- https://doi.org/10.1109/mape62875.2024.10924463
- Primary Topic
- RFID technology advancements
- Type
- article
- Field-Weighted Citation Impact
- 0.00