An Efficient Simulation Method for Self-Heating Effect of GaN HEMTs with Time Scaling Factor

To address the issue of low efficiency for electro-thermal coupling in physical modeling, a time scaling factor is proposed to expedite the simulation process of self-heating effects. Firstly, the two-dimensional electron gas (2DEG) produced by polarization effects, and heterojunction formed by the contact of different semiconductor materials in GaN HEMTs are characterized by continuity conditions. Then, the process of scaling factor acting by electrical and thermal time stepping is introduced. Simulation results show that the proposed method can save 93% computing time and 54% computing memory compared with COMSOL while ensuring accuracy. The self-developed algorithm provides a novel analysis scheme for the electrothermal characterization of devices.

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Published
2024-11-27
DOI
https://doi.org/10.1109/mape62875.2024.10924466
Primary Topic
GaN-based semiconductor devices and materials
Type
article
Field-Weighted Citation Impact
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article

An Efficient Simulation Method for Self-Heating Effect of GaN HEMTs with Time Scaling Factor

Huaguang Bao, Dazhi Ding, Tiancheng Zhang, Chunyu Li
GaN-based semiconductor devices and materials
article

An Efficient Simulation Method for Self-Heating Effect of GaN HEMTs with Time Scaling Factor

Huaguang Bao, Dazhi Ding, Tiancheng Zhang, Chunyu Li
article en

Abstract

To address the issue of low efficiency for electro-thermal coupling in physical modeling, a time scaling factor is proposed to expedite the simulation process of self-heating effects. Firstly, the two-dimensional electron gas (2DEG) produced by polarization effects, and heterojunction formed by the contact of different semiconductor materials in GaN HEMTs are characterized by continuity conditions. Then, the process of scaling factor acting by electrical and thermal time stepping is introduced. Simulation results show that the proposed method can save 93% computing time and 54% computing memory compared with COMSOL while ensuring accuracy. The self-developed algorithm provides a novel analysis scheme for the electrothermal characterization of devices.

Nanjing University of Science and Technology (CN)
National Natural Science Foundation of China, Fundamental Research Funds for the Central Universities
Affordable and clean energy
Openalex Percentile: Top 83%
GaN-based semiconductor devices and materials
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An Efficient Simulation Method for Self-Heating Effect of GaN HEMTs with Time Scaling Factor — Huaguang Bao, Dazhi Ding, et al. · (2024) | TGRS Research Map | TGRS