Background reduction in nano-photoluminescence measurements through tapping-mode demodulation
Nano-photoluminescence (nano-PL) measurements have proven in the past decade to be an incredibly powerful and direct way of probing the excited state physics beyond the diffraction limit. A prevalent issue with nano-PL measurements is background rejection if the Purcell enhancement from the plasmonic tip does not outright outcompete the far-field PL background. To this end, we have implemented a combination of tapping mode AFM and Fourier analysis to improve the far-field rejection of nano-PL measurements. By conducting tapping mode nano-PL measurements on various Transition Metal Dichalcogenide (TMD) samples, we demonstrate that we can image features with better contrast than with the conventional nano-PL mode of operation.
Authors
- Kevin W. C. Kwock (ORCID: https://orcid.org/0000-0001-8976-8881)
- James Hone (ORCID: https://orcid.org/0000-0002-8084-3301)
- P. James Schuck (ORCID: https://orcid.org/0000-0001-9244-2671)
- Thomas P. Darlington (ORCID: https://orcid.org/0000-0002-3498-3936)
- H. W. Lee
- Matthew Fu (ORCID: https://orcid.org/0009-0002-2097-1245)
- D. N. Basov (ORCID: https://orcid.org/0000-0001-9785-5387)
- Abhay N. Pasupathy (ORCID: https://orcid.org/0000-0002-2744-0634)
- Cory R. Dean (ORCID: https://orcid.org/0000-0003-2967-5960)
- Samuel Moore (ORCID: https://orcid.org/0000-0002-0306-2624)
- Suheng Xu (ORCID: https://orcid.org/0000-0002-1456-5489)
- Birui Yang (ORCID: https://orcid.org/0009-0000-2346-8173)
- Jordan Pack (ORCID: https://orcid.org/0000-0001-9179-8668)
- Shuai Zhang (ORCID: https://orcid.org/0000-0003-0721-9294)
- Emanuel S. Yanev
- Jonas Kolker
Institutions
- Rice University (US)
- Columbia University (US)
Publication Details
- Published
- 2025-03-19
- DOI
- https://doi.org/10.1117/12.3039814
- Primary Topic
- Photonic and Optical Devices
- Type
- article
- Field-Weighted Citation Impact
- 0.00