Enhanced reliability and precision for internal laser processing of semiconductors using temporal domain strategies

Authors

Niladri Ganguly (ORCID: https://orcid.org/0000-0002-6638-8066)
Pol Sopeña (ORCID: https://orcid.org/0000-0003-4112-3886)
Alexandros Mouskeftaras (ORCID: https://orcid.org/0000-0002-4082-2880)
David Grojo (ORCID: https://orcid.org/0000-0002-8189-3781)
Andong Wang (ORCID: https://orcid.org/0000-0001-9446-1294)

Publication Details

Published: 2025-03-19
DOI: https://doi.org/10.1117/12.3049658
Primary Topic: Advanced Surface Polishing Techniques
Type: article
Field-Weighted Citation Impact: 0.00

Funders

European Commission
Agence Nationale de la Recherche

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article

Enhanced reliability and precision for internal laser processing of semiconductors using temporal domain strategies

Niladri Ganguly, Pol Sopeña, Alexandros Mouskeftaras, David Grojo et al.

Mar 19, 2025

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Advanced Surface Polishing Techniques

article

Enhanced reliability and precision for internal laser processing of semiconductors using temporal domain strategies

Niladri Ganguly, Pol Sopeña, Alexandros Mouskeftaras, David Grojo, Andong Wang

March 19, 2025article en

Abstract

No abstract available for this paper.

European Commission, Agence Nationale de la Recherche

Openalex Percentile: Top 95%

Advanced Surface Polishing Techniques

DOI Open Access PDF OpenAlex

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Enhanced reliability and precision for internal laser processing of semiconductors using temporal domain strategies — Niladri Ganguly, Pol Sopeña, et al. · (2025) | TGRS Research Map | TGRS