Quantum dot lasers at 300 mm for silicon photonics and datacenter optical interconnect applications

Quantum Dot Lasers are seeing a resurgence of interest as potential replacements for optical transceivers in energy efficient datacentres. Integration of QDLs onto Si photonics platforms enables low-cost mass production of datacom lasers by leveraging established CMOS foundry processing. Access to a 150mm GaAs based QDL enables any established GaAs manufacturer to enter the datacom sector. Wafer to wafer variation <3nm and within wafer variation < 0.25% at 1290 nm is typical for a multi wafer run. A p-down version enables with an RMS <0.5nm enables flip chip bonding of III-V materials. Data for QDs heterogeneously grown on a 300mm PIC shows positioning of a QD region within 80nm of the waveguide after 3um of epitaxy. Growth of QDLs on Ge will also be presented. This offers a path to 300mm but is best suited to a cost effective 200mm solution. Moreover, Ge substrates are CMOS compatible. Data will show similar PL characteristics to material grown on GaAs. In summary we will present data from a high volume QDL manufacturing platform that can meet the demands of substrate form factor, substrate material and upstream QDL process flow.

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Published
2025-03-19
DOI
https://doi.org/10.1117/12.3044139
Primary Topic
Photonic and Optical Devices
Type
article
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Quantum dot lasers at 300 mm for silicon photonics and datacenter optical interconnect applications

Rodney Pelzel, Nasser Babazadeh, Kathryn E. Sautter, Andrew Clark et al.
Photonic and Optical Devices
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Quantum dot lasers at 300 mm for silicon photonics and datacenter optical interconnect applications

Rodney Pelzel, Nasser Babazadeh, Kathryn E. Sautter, Andrew Clark, Mark J. Furlong
article en

Abstract

Quantum Dot Lasers are seeing a resurgence of interest as potential replacements for optical transceivers in energy efficient datacentres. Integration of QDLs onto Si photonics platforms enables low-cost mass production of datacom lasers by leveraging established CMOS foundry processing. Access to a 150mm GaAs based QDL enables any established GaAs manufacturer to enter the datacom sector. Wafer to wafer variation <3nm and within wafer variation < 0.25% at 1290 nm is typical for a multi wafer run. A p-down version enables with an RMS <0.5nm enables flip chip bonding of III-V materials. Data for QDs heterogeneously grown on a 300mm PIC shows positioning of a QD region within 80nm of the waveguide after 3um of epitaxy. Growth of QDLs on Ge will also be presented. This offers a path to 300mm but is best suited to a cost effective 200mm solution. Moreover, Ge substrates are CMOS compatible. Data will show similar PL characteristics to material grown on GaAs. In summary we will present data from a high volume QDL manufacturing platform that can meet the demands of substrate form factor, substrate material and upstream QDL process flow.

IQE (United States) (US)
Openalex Percentile: Top 96%
Photonic and Optical Devices
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