Demonstration of 3-in full-wafer monolithic fabrication and wafer-level testing of MEMS-tunable single-mode ~1060nm VCSELs
Billions of MEMS devices and VCSELs currently circulate in consumer electronics such as smart phones. MEMS-VCSEL is the cutting edge swept tuned light source for optical coherence tomography with unprecedented speed and tuning bandwidth which dictate image acquisition and resolution respectively. We demonstrated 3-inch full wafer monolithic fabrication and wafer level test of single mode MEMS tunable VCSELs with 100nm tuning range at >500kHz tuning repetition rates, enabling path for high performance light source to meet high-volume, low-cost applications. To the best of our knowledge, Praevium is the first to demonstrate monolithic, wafer scale MEMS combined with VCSELs to produce thousands of dies on a 3-inch full GaAs wafer tested at wafer level. The MEMS release process and uniformity afford full 3-inch wafer level MEMS-VCSEL testing such that individual die can be screened on a modified commercial wafer prober.
Authors
- Carmen M. Ruiz (ORCID: https://orcid.org/0000-0001-8535-7516)
- D. L. Lyon
- Wan Ying Ho (ORCID: https://orcid.org/0000-0001-7089-6912)
- Christopher B. Burgner (ORCID: https://orcid.org/0009-0009-6414-2917)
- Christian Iversen
- H. Issa
- J.V. Hryniewicz
- Vijaysekhar Jayaraman
- A. Yang
- Douglas Eber
- Daniel Kaas
Institutions
- Thorlabs (United States) (US)
- Praevium Research (United States) (US)
Publication Details
- Published
- 2025-03-19
- DOI
- https://doi.org/10.1117/12.3056663
- Primary Topic
- Semiconductor Lasers and Optical Devices
- Type
- article
- Field-Weighted Citation Impact
- 0.00