Predicting the statistical error of analog particle tracing Monte Carlo

Large particle systems are often described by high-dimensional (linear) kinetic equations that are simulated using Monte Carlo methods for which the asymptotic convergence rate is independent of the dimensionality. Even though the asymptotic convergence rate is known, predicting the actual value of the statistical error remains a challenging problem. In this paper, we show how the statistical error of an analog particle tracing Monte Carlo method can be calculated (expensive) and predicted a priori (cheap) when estimating quantities of interest (QoI) on a histogram. We consider two types of QoI estimators: point estimators for which each particle provides one independent contribution to the QoI estimates, and analog estimators for which each particle provides multiple correlated contributions to the QoI estimates. The developed statistical error predictors can be applied to other QoI estimators and nonanalog simulation routines as well. The error analysis is based on interpreting the number of particle visits to a histogram bin as the result of a (correlated) binomial experiment. The resulting expressions can be used to optimize (non)analog particle tracing Monte Carlo methods and hybrid simulation methods involving a Monte Carlo component, as well as to select an optimal particle tracing Monte Carlo method from several available options. Additionally, the cheap statistical error predictors can be used to determine a priori the number of particles $ N $ that is needed to reach a desired accuracy. We illustrate the theory using a linear kinetic equation describing neutral particles in the plasma edge of a fusion device and show numerical results. The code used to perform the numerical experiments is openly available.

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Publication Details

Journal
Kinetic and Related Models
Published
2025-01-01
DOI
https://doi.org/10.3934/krm.2025009
Primary Topic
Electron and X-Ray Spectroscopy Techniques
Type
article
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article

Predicting the statistical error of analog particle tracing Monte Carlo

Vince Maes, Giovanni Samaey, Julian Koellermeier, Hannes Vandecasteele et al.
Kinetic and Related Models
Electron and X-Ray Spectroscopy Techniques
article

Predicting the statistical error of analog particle tracing Monte Carlo

Vince Maes, Giovanni Samaey, Julian Koellermeier, Hannes Vandecasteele, Martine Baelmans, Ignace Bossuyt, W. Dekeyser
article en

Abstract

Large particle systems are often described by high-dimensional (linear) kinetic equations that are simulated using Monte Carlo methods for which the asymptotic convergence rate is independent of the dimensionality. Even though the asymptotic convergence rate is known, predicting the actual value of the statistical error remains a challenging problem. In this paper, we show how the statistical error of an analog particle tracing Monte Carlo method can be calculated (expensive) and predicted a priori (cheap) when estimating quantities of interest (QoI) on a histogram. We consider two types of QoI estimators: point estimators for which each particle provides one independent contribution to the QoI estimates, and analog estimators for which each particle provides multiple correlated contributions to the QoI estimates. The developed statistical error predictors can be applied to other QoI estimators and nonanalog simulation routines as well. The error analysis is based on interpreting the number of particle visits to a histogram bin as the result of a (correlated) binomial experiment. The resulting expressions can be used to optimize (non)analog particle tracing Monte Carlo methods and hybrid simulation methods involving a Monte Carlo component, as well as to select an optimal particle tracing Monte Carlo method from several available options. Additionally, the cheap statistical error predictors can be used to determine a priori the number of particles $ N $ that is needed to reach a desired accuracy. We illustrate the theory using a linear kinetic equation describing neutral particles in the plasma edge of a fusion device and show numerical results. The code used to perform the numerical experiments is openly available.

Kinetic and Related ModelsVol. 18(6)
Johns Hopkins University (US), University of Groningen (NL), KU Leuven (BE)
Openalex Percentile: Top 95%
Electron and X-Ray Spectroscopy Techniques
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