Single-shot measurements of shaped XUV FEL pulses with frequency-resolved optical gating

The ability to control the amplitude and phase of extreme ultraviolet (XUV) and X-ray free-electron laser (FEL) pulses can allow for the extension of optical techniques, such as multidimensional spectroscopy or coherent control, to higher photon energies, for probing and controlling core electronic transitions. However, this requires the ability to make single-shot, and complete, electric field measurements of potentially complex FEL pulses, in order to develop, and verify, pulse shaping strategies. Here, we present direct, single-shot measurements of XUV pulses generated under special operating configurations for producing specific pulse shapes from a laser-seeded XUV FEL. To do this, we built upon our past work using transient grating (TG) cross correlation frequency-resolved optical gating (FROG), where an optical reference pulse is diffracted from an XUV TG produced by a pair of interfering FEL pulses. The resulting nonlinear signal versus frequency and delay, i.e., the FROG trace, contains the electric field of the FEL pulse. The FEL pulse electric field is reconstructed from the FROG trace using a phase retrieval algorithm. Here we confirmed three different pulse shaping strategies for generating chirped, double and multiple FEL pulses by tuning the seed laser and FEL parameters and measuring the resulting shaped FEL pulses with TG XFROG. This work paves the way for generating on-demand pulse shapes with a seeded FEL by improving the characterization of FEL pulses, for transform-limited to more complex shapes.

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Publication Details

Journal
Optics Express
Published
2025-03-18
DOI
https://doi.org/10.1364/oe.549398
Primary Topic
Advanced X-ray Imaging Techniques
Type
article
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article

Single-shot measurements of shaped XUV FEL pulses with frequency-resolved optical gating

Pamela Bowlan, I. Nikolov, Alexander Scheinker, M. Danailov et al.
Optics Express
Advanced X-ray Imaging Techniques
article

Single-shot measurements of shaped XUV FEL pulses with frequency-resolved optical gating

Pamela Bowlan, I. Nikolov, Alexander Scheinker, M. Danailov, Filippo Bencivenga, Laura Foglia, L. Giannessi, D. Garzella, Emanuele Pedersoli, Peter Šušnjar, P. J. Skrodzki, Alberto Simoncig, Matteo Pancaldi, Flavio Capotondi, Francesca Elverson
article en

Abstract

The ability to control the amplitude and phase of extreme ultraviolet (XUV) and X-ray free-electron laser (FEL) pulses can allow for the extension of optical techniques, such as multidimensional spectroscopy or coherent control, to higher photon energies, for probing and controlling core electronic transitions. However, this requires the ability to make single-shot, and complete, electric field measurements of potentially complex FEL pulses, in order to develop, and verify, pulse shaping strategies. Here, we present direct, single-shot measurements of XUV pulses generated under special operating configurations for producing specific pulse shapes from a laser-seeded XUV FEL. To do this, we built upon our past work using transient grating (TG) cross correlation frequency-resolved optical gating (FROG), where an optical reference pulse is diffracted from an XUV TG produced by a pair of interfering FEL pulses. The resulting nonlinear signal versus frequency and delay, i.e., the FROG trace, contains the electric field of the FEL pulse. The FEL pulse electric field is reconstructed from the FROG trace using a phase retrieval algorithm. Here we confirmed three different pulse shaping strategies for generating chirped, double and multiple FEL pulses by tuning the seed laser and FEL parameters and measuring the resulting shaped FEL pulses with TG XFROG. This work paves the way for generating on-demand pulse shapes with a seeded FEL by improving the characterization of FEL pulses, for transform-limited to more complex shapes.

Optics ExpressVol. 33(9)
Los Alamos National Laboratory (US), Istituto Nazionale di Fisica Nucleare (IT), Elettra-Sincrotrone Trieste S.C.p.A. (IT)
Affordable and clean energy
Openalex Percentile: Top 93%
Advanced X-ray Imaging Techniques
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