PSO-Based Optimal Coverage Path Planning for Surface Defect Inspection of 3C Components With a Robotic Line Scanner

The automatic inspection of surface defects is an essential task for quality control in the computers, communications, and consumer (3C) electronics industry. Traditional inspection mechanisms (i.e., line-scan sensors) have a limited field of view (FOV), thus prompting the necessity for a multifaceted robotic inspection system capable of comprehensive scanning. Optimally selecting the robot’s viewpoints and planning a path is regarded as coverage path planning (CPP), a problem that enables inspecting the object’s complete surface while reducing the scanning time and avoiding misdetection of defects. In this article, we present a new approach for robotic line scanners to detect surface defects of 3C free-form objects automatically. A two-stage region segmentation method defines the local scanning based on the random sample consensus (RANSAC) and K-means clustering to improve the inspection coverage. The proposed method also consists of an adaptive region-of-interest (ROI) algorithm to define the local scanning paths. Besides, a particle swarm optimization (PSO)-based method is used for global inspection path generation to minimize the inspection time. The developed method is validated by simulation-based and experimental studies on various free-form workpieces, and its performance is compared with that of two state-of-the-art solutions. The reported results demonstrate the feasibility and effectiveness of our proposed method.

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Publication Details

Journal
IEEE Transactions on Instrumentation and Measurement
Published
2025-01-01
DOI
https://doi.org/10.1109/tim.2025.3552466
Citations
7
Primary Topic
Industrial Vision Systems and Defect Detection
Type
article
Field-Weighted Citation Impact
8.70
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article

PSO-Based Optimal Coverage Path Planning for Surface Defect Inspection of 3C Components With a Robotic Line Scanner

Hongpeng Chen, Yuli Liu, Shengzeng Huo, David Navarro-Alarcón et al.
7 citations
IEEE Transactions on Instrumentation and Measurement
Industrial Vision Systems and Defect Detection
8.70
article

PSO-Based Optimal Coverage Path Planning for Surface Defect Inspection of 3C Components With a Robotic Line Scanner

Hongpeng Chen, Yuli Liu, Shengzeng Huo, David Navarro-Alarcón, Hoi-Yin Lee, Anqing Duan, Pai Zheng, Muhammad Muddassir, Junxi Li
article en
7 citations

Abstract

The automatic inspection of surface defects is an essential task for quality control in the computers, communications, and consumer (3C) electronics industry. Traditional inspection mechanisms (i.e., line-scan sensors) have a limited field of view (FOV), thus prompting the necessity for a multifaceted robotic inspection system capable of comprehensive scanning. Optimally selecting the robot’s viewpoints and planning a path is regarded as coverage path planning (CPP), a problem that enables inspecting the object’s complete surface while reducing the scanning time and avoiding misdetection of defects. In this article, we present a new approach for robotic line scanners to detect surface defects of 3C free-form objects automatically. A two-stage region segmentation method defines the local scanning based on the random sample consensus (RANSAC) and K-means clustering to improve the inspection coverage. The proposed method also consists of an adaptive region-of-interest (ROI) algorithm to define the local scanning paths. Besides, a particle swarm optimization (PSO)-based method is used for global inspection path generation to minimize the inspection time. The developed method is validated by simulation-based and experimental studies on various free-form workpieces, and its performance is compared with that of two state-of-the-art solutions. The reported results demonstrate the feasibility and effectiveness of our proposed method.

IEEE Transactions on Instrumentation and MeasurementVol. 74
Hong Kong Polytechnic University (HK), University of Macau (MO), Mohamed bin Zayed University of Artificial Intelligence (AE)
Openalex Percentile: Top 3%
Industrial Vision Systems and Defect Detection
8.70
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