Electron Inversion and Tunneling at Silicon Thermal Oxide Interfaces for Solar-Driven Molecular Catalysis to Syngas
Semiconductor photoelectrodes are regularly coupled to solid-state heterogeneous catalysts to perform solar-driven reduction of CO<sub>2</sub>. Less frequently, molecular catalysts are employed to better control the reactivity toward desired products, yet the development of robust semiconductor/molecule interfaces has proven challenging. Here, we demonstrate that a 2-3 nm thermal oxide layer on Si exhibits stability in aqueous solution, high photovoltage, and a photocurrent density of ∼10 mA/cm<sup>2</sup> for the solar-driven photoelectrochemical reduction of a homogeneous molecular catalyst, producing syngas with an ∼2:1 H<sub>2</sub> to CO ratio. Because of a low defect density, the oxide interface forms an electron inversion layer with metal-like electron density at cathodic potentials. This inversion layer facilitates electron transfer to redox-active molecules via tunneling even if the molecule's reduction potential is beyond the semiconductor's conduction band edge. Using an electrolyte solution composed of a homogeneous cobalt bis(terpyridine) catalyst in a water/organic solvent mixture, stable photoelectrochemistry was observed under 1-sun illumination, exhibiting an ∼30% Faradaic efficiency for CO that was similar to a glassy carbon electrode under comparable conditions. The results demonstrate that an ultrathin thermal oxide interface is a robust platform for development of aqueous-stable, molecule-driven photoelectrocatalysis.
Authors
- Taylor S. Teitsworth (ORCID: https://orcid.org/0000-0001-8487-9785)
- James F. Cahoon (ORCID: https://orcid.org/0000-0003-1780-215X)
- Stephen J. Tereniak (ORCID: https://orcid.org/0000-0003-4978-0020)
- Renato N. Sampaio (ORCID: https://orcid.org/0000-0002-7158-6470)
- Niklas Keller (ORCID: https://orcid.org/0000-0003-1581-072X)
- Matthew R. Lockett (ORCID: https://orcid.org/0000-0003-4851-7757)
- Samuel R. Bottum (ORCID: https://orcid.org/0000-0002-8180-6692)
- Samuel Jaeho Shin (ORCID: https://orcid.org/0000-0002-7246-8062)
- John C. Dickenson (ORCID: https://orcid.org/0000-0002-7788-6810)
- Gerald J. Meyer (ORCID: https://orcid.org/0000-0002-4227-6393)
- Alexander J. M. Miller (ORCID: https://orcid.org/0000-0001-9390-3951)
- Ryan J. Gentile (ORCID: https://orcid.org/0000-0003-1067-7085)
- Carrie L. Donley (ORCID: https://orcid.org/0000-0003-0906-306X)
- Gregory N. Parsons (ORCID: https://orcid.org/0000-0002-0048-5859)
- Jillian L. Dempsey (ORCID: https://orcid.org/0000-0002-9459-4166)
- Hannah R. M. Margavio (ORCID: https://orcid.org/0000-0001-5327-3713)
- Oluwaseun A. Oyetade (ORCID: https://orcid.org/0000-0003-0334-4573)
- Shi He
Institutions
- University of North Carolina at Chapel Hill (US)
- North Carolina State University (US)
Publication Details
- Journal
- Journal of the American Chemical Society
- Published
- 2025-03-18
- DOI
- https://doi.org/10.1021/jacs.4c17251
- Citations
- 8
- Primary Topic
- Electronic and Structural Properties of Oxides
- Type
- article
- Field-Weighted Citation Impact
- 4.14
Funders
- Division of Electrical, Communications and Cyber Systems
- Basic Energy Sciences