Uncertainty evaluation in simulation study on range-shift estimation due to statistical noise in secondary electron bremsstrahlung from a small number of carbon ions
Abstract Secondary electron bremsstrahlung (SEB) has been proposed for range verification in particle therapy. However, the uncertainty in range-shift estimation due to high statistical noise under small numbers of carbon ion irradiation remains unclear. This simulation study evaluated the uncertainty of SEB-based range-shift estimations under conditions with limited numbers of carbon ions. The SEB images were generated by irradiating an acrylic target with monoenergetic carbon-ion beams and calculating the energy deposited onto a cadmium telluride pixel detector in simulation. Estimated range shifts were derived from the obtained SEB images using our proposed range-shift estimation method. As a result, the uncertainty was 1.4 mm for 10 8 ions and 4.4 mm for 10 7 ions. The results suggested that improving the sensitivity of the detector is effective in reducing the uncertainty.
Authors
- Naoki Kawachi (ORCID: https://orcid.org/0000-0002-3991-5035)
- Makoto Sakai (ORCID: https://orcid.org/0000-0001-9928-2375)
- Hiroshi Watabe (ORCID: https://orcid.org/0000-0001-6257-7735)
- Tomihiro Kamiya (ORCID: https://orcid.org/0000-0001-9711-9507)
- Wataru Kada (ORCID: https://orcid.org/0000-0003-4863-3037)
- Yuto Nagao (ORCID: https://orcid.org/0009-0004-6852-0405)
- Mitsutaka Yamaguchi (ORCID: https://orcid.org/0000-0002-3412-4066)
- M. Tsuda
- Yabe Takuya
Institutions
- Gunma University (JP)
- Tohoku University (JP)
- National Institutes for Quantum Science and Technology (JP)
- Gunma University Hospital (JP)
Publication Details
- Journal
- Japanese Journal of Applied Physics
- Published
- 2025-03-18
- DOI
- https://doi.org/10.35848/1347-4065/adc21b
- Primary Topic
- Integrated Circuits and Semiconductor Failure Analysis
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- Japan Society for the Promotion of Science