X-ray Multilens Interferometer based on Silicon Refractive Lenses for Diagnostic of the Coherent Properties of Radiation
We are proposing an experimental demonstration of the change in the degree of coherence of X‑ray radiation scattered within a volume of high dispersion, weakly absorbing material—termed a decoherer. A multilens interferometer based on silicon planar compound refractive lenses is used as a diagnostic tool. The experiment was conducted at the ID13B beamline of the ESRF synchrotron radiation source (Grenoble, France) at an X-ray energy of 12.4 keV. The gradual increase in the thickness of the decoherer allowed for the observation of the degradation of the interference fringes formed by the interferometer.
Authors
- D. Zverev (ORCID: https://orcid.org/0000-0002-7111-3825)
- S. Kuznetsov (ORCID: https://orcid.org/0000-0001-6847-1384)
- Mikhail Sorokovikov (ORCID: https://orcid.org/0000-0002-5260-6034)
- A. Snigirev (ORCID: https://orcid.org/0000-0002-8892-1925)
- V. Yunkin
Institutions
- Immanuel Kant Baltic Federal University (RU)
- Institute of Microelectronics Technology and High Purity Materials (RU)
Publication Details
- Journal
- Journal of Surface Investigation X-ray Synchrotron and Neutron Techniques
- Published
- 2024-12-01
- DOI
- https://doi.org/10.1134/s1027451024701854
- Primary Topic
- Advanced X-ray Imaging Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00